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Mineral analysis technique using SEM-EDX quantitative mapping images.

In material analysis and research and development, information about the properties of the target sample and the temporal changes observed through testing is extremely important!

We have developed a technology that clarifies the local compositional information of minerals and visualizes their distribution state by combining quantitative mapping images obtained through Scanning Electron Microscopy - Energy Dispersive X-ray Analysis (SEM-EDX) with our proprietary algorithms. Due to the nature of the measurements, it is possible to observe the same sample and the same field of view, making it a useful technique for observing temporal changes in the sample. By utilizing this technology, it is possible to investigate the temporal changes in hydration reactions and elucidate the mechanisms of state changes. 【Analytical Equipment】 ■ Scanning Electron Microscope SEM ・TM3030plus (manufactured by Hitachi High-Technologies) ■ Energy Dispersive X-ray Analyzer EDX ・QUANTAX75 Esprit Compact (manufactured by Bruker) *For more details, please download the PDF or feel free to contact us.

  • Other physical property measurements and component analysis

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